Journal article
Accurate Nanoscale Crystallography in Real-Space Using Scanning Transmission Electron Microscopy
JH Dycus, JS Harris, X Sang, CM Fancher, SD Findlay, AA Oni, TTE Chan, CC Koch, JL Jones, LJ Allen, DL Irving, JM Le Beau
Microscopy and Microanalysis | Published : 2015
Abstract
Here, we report reproducible and accurate measurement of crystallographic parameters using scanning transmission electron microscopy. This is made possible by removing drift and residual scan distortion. We demonstrate real-space lattice parameter measurements with <0.1% error for complex-layered chalcogenides Bi2Te3, Bi2Se3, and a Bi2Te2.7Se0.3 nanostructured alloy. Pairing the technique with atomic resolution spectroscopy, we connect local structure with chemistry and bonding. Combining these results with density functional theory, we show that the incorporation of Se into Bi2Te3 causes charge redistribution that anomalously increases the van der Waals gap between building blocks of the la..
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Grants
Awarded by National Science Foundation
Funding Acknowledgements
J.H.D., X.S., and J.M.L. gratefully acknowledge support from the Air Force Office of Scientific Research (Grant No. FA9550-14-1-0182). J.H.D. acknowledges support for this work by the National Science Foundation Graduate Research Fellowship (Grant DGE-1252376). J.S.H. and D.L.I. acknowledge support for the DFT work from a grant from the National Science Foundation, DMR-1151568. T.E.C. and C.C.K. acknowledge support through DARPA/DSO (Contract W911NF-08-C-0058). The authors acknowledge the use of the Analytical Instrumentation Facility (AIF) at North Carolina State University, which is supported by the State of North Carolina and the National Science Foundation. S.D.F. and L.J.A. were supported under the Discovery Projects funding scheme of the Australian Research Council (Projects DP140102538 and DP110102228). Use of the Advanced Photon Source at Argonne National Laboratory was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences (Contract DE-AC02-06CH11357).